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Conference contributions
Bump pad design and its impact on the reliability of flip chip packages
Publication:
Bump pad design and its impact on the reliability of flip chip packages
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gonzalez, Mario
;
Lofrano, Melina
;
Vanstreels, Kris
;
Zahedmanesh, Houman
;
Beyne, Eric
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Abstract
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1995
since deposited on 2021-10-25
Acq. date: 2026-01-07
Citations
Metrics
Views
1995
since deposited on 2021-10-25
Acq. date: 2026-01-07
Citations