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Development and Characterization of Electrodeposited Tin-Indium Alloy Microbumps for Low Temperature Assembly

 
dc.contributor.authorDobrovolska, Tsvetina
dc.contributor.authorMack, Martin
dc.contributor.authorLeyendecker, Klaus
dc.contributor.authorMartin, Kevin
dc.contributor.authorRadisic, Alex
dc.contributor.authorShafahian, Ehsan
dc.contributor.authorMudigere Krishne Gowda, Punith
dc.contributor.authorDerakhshandeh, Jaber
dc.contributor.authorStruyf, Herbert
dc.date.accessioned2026-03-31T09:16:38Z
dc.date.available2026-03-31T09:16:38Z
dc.date.createdwos2025-10-31
dc.date.issued2025
dc.description.abstractThe newly developed tin-indium (Sn-In) electrolyte enables the electrochemical deposition of eutectic and neareutectic Sn-In alloys containing 45-55 wt.% indium. The reflow process was successfully conducted at temperatures below 150∘C, approaching the eutectic melting point of Sn -In and remaining lower than the melting temperature of pure indium. Additionally, the results of the preliminary bonding tests are presented, demonstrating the potential of this electrolyte for lowtemperature assembly applications.
dc.identifier.doi10.1109/ECTC51687.2025.00328
dc.identifier.isbn979-8-3315-3933-7
dc.identifier.issn0569-5503
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/58989
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE COMPUTER SOC
dc.source.beginpage1924
dc.source.conferenceIEEE 75th Electronic Components and Technology Conference (ECTC)
dc.source.conferencedate2025-05-27
dc.source.conferencelocationDallas
dc.source.endpage1928
dc.source.journal2025 IEEE 75TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC
dc.source.numberofpages5
dc.title

Development and Characterization of Electrodeposited Tin-Indium Alloy Microbumps for Low Temperature Assembly

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2025-10-22
imec.internal.sourcecrawler
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