Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Scanning probe spectroscopy of individual dopants in silicon
Publication:
Scanning probe spectroscopy of individual dopants in silicon
Copy permalink
Date
2009
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gasseler, Morewell
;
Caymax, Matty
;
Loo, Roger
;
Rogge, Sven
;
Tessmer, Stuart
Journal
Abstract
Description
Statistics
Views
1867
since deposited on 2021-10-17
Acq. date: 2026-08-06
Citations
Statistics
Views
1867
since deposited on 2021-10-17
Acq. date: 2026-08-06
Citations