Publication:

First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling

Date

2008
Proceedings Paper
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dc.contributor.authorMerelle, Thomas
dc.contributor.authorCuratola, Gilberto
dc.contributor.authorNackaerts, Axel
dc.contributor.authorCollaert, Nadine
dc.contributor.authorVan Dal, Mark
dc.contributor.authorDoornbos, Gerben
dc.contributor.authorDoorn, T.S.
dc.contributor.authorChristie, Phillip
dc.contributor.authorVellianitis, Georgios
dc.contributor.authorDuriez, Blandine
dc.contributor.authorDuffy, Ray
dc.contributor.authorPawlak, Bartek
dc.contributor.authorVoogt, F.C.
dc.contributor.authorRooyackers, Rita
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorJurczak, Gosia
dc.contributor.authorLander, Rob
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorVan Dal, Mark
dc.contributor.imecauthorDoornbos, Gerben
dc.contributor.imecauthorChristie, Phillip
dc.contributor.imecauthorVellianitis, Georgios
dc.contributor.imecauthorDuriez, Blandine
dc.contributor.imecauthorPawlak, Bartek
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-17T08:57:44Z
dc.date.available2021-10-17T08:57:44Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14151
dc.source.beginpage241
dc.source.conferenceTechnical Digest International Electron Devices Meeting - IEDM
dc.source.conferencedate15/12/2008
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage244
dc.title

First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling

dc.typeProceedings paper
dspace.entity.typePublication
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