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Depth profiling of elastic inhomogeneities in transoarent nanomaterials by picosecond ultrasonic interferometry

Date

2009
Journal article
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dc.contributor.authorMechri, C
dc.contributor.authorRuello, P
dc.contributor.authorBreteau, J.M.
dc.contributor.authorBaklanov, Mikhaïl
dc.contributor.authorVerdonck, Patrick
dc.contributor.authorGusev, V
dc.contributor.imecauthorVerdonck, Patrick
dc.contributor.orcidimecVerdonck, Patrick::0000-0003-2454-0602
dc.date.accessioned2021-10-18T00:43:08Z
dc.date.available2021-10-18T00:43:08Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15847
dc.source.beginpage91907
dc.source.issue9
dc.source.journalApplied Physics Letters
dc.source.volume95
dc.title

Depth profiling of elastic inhomogeneities in transoarent nanomaterials by picosecond ultrasonic interferometry

dc.typeJournal article
dspace.entity.typePublication
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