Publication:

Physical understanding of SANOS disturbs and VARIOT engineered barrier as a solution

Date

2007
Proceedings Paper
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dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorCacciato, Antonio
dc.contributor.authorBreuil, Laurent
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorMaes, Herman
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-16T16:11:38Z
dc.date.available2021-10-16T16:11:38Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12174
dc.source.beginpage94
dc.source.conference22nd Non-Voltaile Semiconductor Memory Workshop - NVSMW
dc.source.conferencedate27/08/2007
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage95
dc.title

Physical understanding of SANOS disturbs and VARIOT engineered barrier as a solution

dc.typeProceedings paper
dspace.entity.typePublication
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