Publication:

Roadblocks and critical aspect of cleaning for sub-65nm technologies

Date

 
dc.contributor.authorMertens, Paul
dc.contributor.imecauthorMertens, Paul
dc.date.accessioned2021-10-16T03:26:05Z
dc.date.available2021-10-16T03:26:05Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10886
dc.source.beginpage95
dc.source.conferenceProceedings IEEE VLSI-TSA International Symposium on VLSI Technology
dc.source.conferencedate25/04/2005
dc.source.conferencelocationHsinchu Taiwan
dc.source.endpage96
dc.title

Roadblocks and critical aspect of cleaning for sub-65nm technologies

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections: