Publication:
Accuracy Study of the Differential Surface Admittance Operator for Lossy Metal Characterization
| dc.contributor.author | Huynen, Martijn | |
| dc.contributor.author | Fominatovksi, V | |
| dc.contributor.author | De Zutter, Daniel | |
| dc.contributor.author | Vande Ginste, Dries | |
| dc.contributor.imecauthor | Huynen, M. | |
| dc.contributor.imecauthor | De Zutter, D. | |
| dc.contributor.imecauthor | Ginste, D. Vande | |
| dc.date.accessioned | 2025-03-14T18:11:31Z | |
| dc.date.available | 2025-03-14T18:11:31Z | |
| dc.date.issued | 2024 | |
| dc.identifier.doi | 10.1109/EPEPS61853.2024.10754173 | |
| dc.identifier.eisbn | 979-8-3503-5123-1 | |
| dc.identifier.isbn | 979-8-3503-5124-8 | |
| dc.identifier.issn | 2165-4107 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45392 | |
| dc.publisher | IEEE | |
| dc.source.conference | 33rd Conference on Electrical Performance of Electronic Packaging and Systems | |
| dc.source.conferencedate | 2024-10-06 | |
| dc.source.conferencelocation | Toronto | |
| dc.source.numberofpages | 3 | |
| dc.subject.keywords | SKIN | |
| dc.title | Accuracy Study of the Differential Surface Admittance Operator for Lossy Metal Characterization | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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