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Conference contributions
NBTI monitoring and design for reliability in nanoscale circuits
Publication:
NBTI monitoring and design for reliability in nanoscale circuits
Date
2011
Proceedings Paper
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24551.pdf
1.29 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Khan, Seyab
;
Haron, Nor Zaidi
;
Hamdioui, Said
;
Catthoor, Francky
Journal
Abstract
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1897
since deposited on 2021-10-19
Acq. date: 2025-10-30
Citations
Metrics
Views
1897
since deposited on 2021-10-19
Acq. date: 2025-10-30
Citations