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VPD-DC-TXRF for metallic contamination analysis of Ge wafers
Publication:
VPD-DC-TXRF for metallic contamination analysis of Ge wafers
Date
2004
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hellin, David
;
Geens, Veerle
;
Teerlinck, Ivo
;
Van Steenbergen, Jan
;
Raskin, Geoffroy
;
Mertens, Paul
;
De Gendt, Stefan
;
Vinckier, Chris
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1926
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1926
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations