Publication:
IEEE P1838: What is it and What is it not?
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-22T03:28:50Z | |
| dc.date.available | 2021-10-22T03:28:50Z | |
| dc.date.issued | 2014-10 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24201 | |
| dc.identifier.url | http://3dtest.tttc-events.org | |
| dc.source.beginpage | na | |
| dc.source.conference | IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits - 3D-TEST | |
| dc.source.conferencedate | 23/10/2014 | |
| dc.source.conferencelocation | Seattle, WA USA | |
| dc.title | IEEE P1838: What is it and What is it not? | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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