Publication:
Stoichiometry and Thickness of Epitaxial SrTiO₃ on Silicon (001): An Investigation of Physical, Optical, and Electrical Properties
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| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-5945-4459 | |
| cris.virtual.orcid | 0000-0002-8947-5293 | |
| cris.virtual.orcid | 0000-0002-7767-6039 | |
| cris.virtual.orcid | 0000-0003-3084-2543 | |
| cris.virtual.orcid | 0000-0002-5380-7348 | |
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| cris.virtualsource.orcid | 85e8ddcb-690c-43bf-95dd-95a4a25533aa | |
| dc.contributor.author | Boelen, Andries | |
| dc.contributor.author | Baryshnikova, Marina | |
| dc.contributor.author | Ulrich, Anja | |
| dc.contributor.author | Brahim, Kamal | |
| dc.contributor.author | Van de Vondel, Joris | |
| dc.contributor.author | Haffner, Christian | |
| dc.contributor.author | Merckling, Clement | |
| dc.contributor.imecauthor | Boelen, Andries | |
| dc.contributor.imecauthor | Baryshnikova, Marina | |
| dc.contributor.imecauthor | Ulrich, Anja | |
| dc.contributor.imecauthor | Brahim, Kamal | |
| dc.contributor.imecauthor | Haffner, Christian | |
| dc.contributor.imecauthor | Merckling, Clement | |
| dc.contributor.orcidimec | Boelen, Andries::0000-0002-5380-7348 | |
| dc.contributor.orcidimec | Baryshnikova, Marina::0000-0002-5945-4459 | |
| dc.contributor.orcidimec | Ulrich, Anja::0000-0002-7767-6039 | |
| dc.contributor.orcidimec | Brahim, Kamal::0000-0002-8687-8302 | |
| dc.contributor.orcidimec | Haffner, Christian::0000-0002-8947-5293 | |
| dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
| dc.date.accessioned | 2025-08-01T04:36:59Z | |
| dc.date.available | 2025-08-01T04:36:59Z | |
| dc.date.issued | 2025-JUL 22 | |
| dc.description.wosFundingText | This research was funded by the Branco Weiss Society and the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation program, grant number 864483 NOTICE and grant number 101042414 Q-AMP. | |
| dc.identifier.doi | 10.1021/acs.cgd.5c00103 | |
| dc.identifier.issn | 1528-7483 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45995 | |
| dc.publisher | AMER CHEMICAL SOC | |
| dc.source.beginpage | 5752 | |
| dc.source.endpage | 5760 | |
| dc.source.issue | 15 | |
| dc.source.journal | CRYSTAL GROWTH & DESIGN | |
| dc.source.numberofpages | 9 | |
| dc.source.volume | 25 | |
| dc.subject.keywords | MOLECULAR-BEAM-EPITAXY | |
| dc.subject.keywords | ROOM-TEMPERATURE | |
| dc.subject.keywords | THIN-FILMS | |
| dc.subject.keywords | SR | |
| dc.subject.keywords | FERROELECTRICITY | |
| dc.subject.keywords | PERMITTIVITY | |
| dc.subject.keywords | OXIDES | |
| dc.subject.keywords | FIELD | |
| dc.title | Stoichiometry and Thickness of Epitaxial SrTiO₃ on Silicon (001): An Investigation of Physical, Optical, and Electrical Properties | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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