Publication:
Improving APT-AFM technology: towards high resolution 3D APT tip shapes
Date
| dc.contributor.author | Op de Beeck, Jonathan | |
| dc.contributor.author | Fleischmann, Claudia | |
| dc.contributor.author | Paredis, Kristof | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Op de Beeck, Jonathan | |
| dc.contributor.imecauthor | Fleischmann, Claudia | |
| dc.contributor.imecauthor | Paredis, Kristof | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.contributor.orcidimec | Op de Beeck, Jonathan::0000-0003-3471-2156 | |
| dc.contributor.orcidimec | Fleischmann, Claudia::0000-0003-1531-6916 | |
| dc.contributor.orcidimec | Paredis, Kristof::0000-0002-5163-4164 | |
| dc.date.accessioned | 2021-10-26T00:25:39Z | |
| dc.date.available | 2021-10-26T00:25:39Z | |
| dc.date.issued | 2018 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31448 | |
| dc.source.conference | Atom Probe Tomography and Microscopy - APT&M | |
| dc.source.conferencedate | 10/06/2018 | |
| dc.source.conferencelocation | Gaithersburg, MD USA | |
| dc.title | Improving APT-AFM technology: towards high resolution 3D APT tip shapes | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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