Publication:

Comparison of methods for online inspection of apple internal quality

Date

2017
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorvan Dael, M.
dc.contributor.authorVerboven, P.
dc.contributor.authorVan Hoorebeke, L.
dc.contributor.authorSijbers, Jan
dc.contributor.authorNicolai, B.
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.date.accessioned2021-10-24T15:36:38Z
dc.date.available2021-10-24T15:36:38Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29632
dc.identifier.urlfile:///C:/Users/naru/Downloads/145595.pdf
dc.source.beginpage1
dc.source.conference7th Conference on Industrial Computed Tomography - iCT
dc.source.conferencedate2/07/2017
dc.source.conferencelocationLeuven Belgium
dc.source.endpage10
dc.title

Comparison of methods for online inspection of apple internal quality

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
38221.pdf
Size:
264.16 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions