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Performance degradation of InGaAs/AlInAs HEMT's under thermal stress
Publication:
Performance degradation of InGaAs/AlInAs HEMT's under thermal stress
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Date
1998
Proceedings Paper
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2737.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van der Zanden, Koen
;
Schreurs, Dominique
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Abstract
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1794
since deposited on 2021-10-01
Acq. date: 2025-12-17
Citations
Metrics
Views
1794
since deposited on 2021-10-01
Acq. date: 2025-12-17
Citations