Publication:

Effect of interface states on 1T-FBRAM cell retention

Date

2012
Proceedings Paper
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dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorBlomme, Pieter
dc.contributor.authorSimoen, Eddy
dc.contributor.authorAltimime, Laith
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.contributor.authorMendes Almeida, Luciano
dc.contributor.authorCaillat, Christian
dc.contributor.authorMahatme, N.N.
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-20T10:01:54Z
dc.date.available2021-10-20T10:01:54Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20292
dc.source.beginpageMY-1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate15/04/2012
dc.source.conferencelocationAnaheim, CA USA
dc.title

Effect of interface states on 1T-FBRAM cell retention

dc.typeProceedings paper
dspace.entity.typePublication
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