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Investigation of iridium as a gate electrode for deep sub-micron CMOS technology
Publication:
Investigation of iridium as a gate electrode for deep sub-micron CMOS technology
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pawlak, M.A.
;
Schram, Tom
;
Maex, Karen
;
Vantomme, Andre
Journal
Microelectronic Engineering
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1890
since deposited on 2021-10-15
Acq. date: 2026-07-17
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Views
1890
since deposited on 2021-10-15
Acq. date: 2026-07-17
Citations