Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis

Rossetto, Isabella; Meneghini, Matteo; Rizzato, Vanessa; Ruzzarin, Maria; Favaron, Andrea; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico

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Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis

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2016

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Meneghesso, Gaudenzio

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Zanoni, Enrico

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Microelectronics Reliability

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Acq. date: 2025-12-13

Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis

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