Publication:

Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction

Date

2017

Proceedings Paper

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Files

37885.pdf 3.36 MB

Author(s)

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Groeseneken, Guido

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Statistics

1944 since deposited on 2021-10-24

Acq. date: 2026-02-25