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Constant current charge-to-breakdown: still a valid tool to study the reliability of MOS structures

Date

1998
Proceedings Paper
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dc.contributor.authorNigam, Tanya
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorHeyns, Marc
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorHeyns, Marc
dc.date.accessioned2021-10-01T08:33:43Z
dc.date.available2021-10-01T08:33:43Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2806
dc.source.beginpage62
dc.source.conferenceProceedings International Reliability Physics Symposium - IRPS
dc.source.conferencedate30/03/1998
dc.source.conferencelocationReno, NV USA
dc.source.endpage69
dc.title

Constant current charge-to-breakdown: still a valid tool to study the reliability of MOS structures

dc.typeProceedings paper
dspace.entity.typePublication
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