Publication:

Degradation of SiGe devices by proton irradiation

Date

1997
Proceedings Paper
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dc.contributor.authorOhyama, Hidenori
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorTakami, Y.
dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorSunaga, H.
dc.contributor.authorNahsiyama, I.
dc.contributor.authorOwatoko, Y.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-09-30T09:23:00Z
dc.date.available2021-09-30T09:23:00Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2074
dc.source.beginpage212
dc.source.conferenceRecent Progress in Accelerator Beam Application. Proceedings of the 7th International Symposium on Advanced Nuclear Energy Resea
dc.source.conferencedate18/03/1996
dc.source.conferencelocationTakasaki Japan
dc.source.endpage217
dc.title

Degradation of SiGe devices by proton irradiation

dc.typeProceedings paper
dspace.entity.typePublication
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