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Spectroscopic study of oxygen related lattice defects in annealed silicon
Publication:
Spectroscopic study of oxygen related lattice defects in annealed silicon
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Date
1994
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Libezny, Milan
;
Simoen, Eddy
;
Claeys, Cor
;
Clauws, P.
;
Blondeel, A.
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2053
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Acq. date: 2026-04-06
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Statistics
Views
2053
since deposited on 2021-09-29
3
last month
1
last week
Acq. date: 2026-04-06
Citations