Publication:

Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFET devices

Date

2011
Proceedings Paper
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dc.contributor.authorEl-Mamouni, F.
dc.contributor.authorZhang, E.X.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorReed, R.A.
dc.contributor.authorGalloway, K.F.
dc.contributor.authorMcMorrow, D.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorCristoloveanu, S.
dc.contributor.authorXiong, W.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-19T13:24:11Z
dc.date.available2021-10-19T13:24:11Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18877
dc.source.beginpage882
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate10/04/2011
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage885
dc.title

Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFET devices

dc.typeProceedings paper
dspace.entity.typePublication
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