Correlation between bias stress instability and phototransistor operation of pentacene thin-film transistors

dc.contributor.author	Debucquoy, Maarten
dc.contributor.author	Verlaak, Stijn
dc.contributor.author	Steudel, Soeren
dc.contributor.author	Myny, Kris
dc.contributor.author	Genoe, Jan
dc.contributor.author	Heremans, Paul
dc.contributor.imecauthor	Debucquoy, Maarten
dc.contributor.imecauthor	Myny, Kris
dc.contributor.imecauthor	Genoe, Jan
dc.contributor.imecauthor	Heremans, Paul
dc.contributor.orcidimec	Debucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimec	Myny, Kris::0000-0002-5230-495X
dc.contributor.orcidimec	Genoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimec	Heremans, Paul::0000-0003-2151-1718
dc.date.accessioned	2021-10-16T15:41:40Z
dc.date.available	2021-10-16T15:41:40Z
dc.date.issued	2007-09
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/12021
dc.source.beginpage	103508
dc.source.issue	91
dc.source.journal	Applied Physics Letters
dc.source.volume	2007
dc.title	Correlation between bias stress instability and phototransistor operation of pentacene thin-film transistors
dc.type	Journal article
dspace.entity.type	Publication
Files
Publication available in collections:	Articles