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Simple and efficient approach for shunt admittance parameters calculations of VLSI on-chip interconnects on semiconducting substrate

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dc.contributor.authorYmeri, Hasan
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorMaex, Karen
dc.contributor.authorDe Roest, David
dc.contributor.authorStucchi, Michele
dc.contributor.authorVandenberghe, S.
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorDe Roest, David
dc.contributor.imecauthorStucchi, Michele
dc.date.accessioned2021-10-15T00:09:08Z
dc.date.available2021-10-15T00:09:08Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7084
dc.source.beginpage1113
dc.source.conferenceDATE 02. Design Automation and Test in Europe Conference and Exhibition. Proceedings
dc.source.conferencedate4/03/2002
dc.source.conferencelocationParis France
dc.title

Simple and efficient approach for shunt admittance parameters calculations of VLSI on-chip interconnects on semiconducting substrate

dc.typeProceedings paper
dspace.entity.typePublication
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