Publication:
Microscopic oxide defects causing BTI, RTN, and SILC on high-K FinFETs
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1899 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-10
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Views
1899 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-10
Citations