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Characterization of InP growth in nm-sized trenches by a combination of NC-AFM and STM
Publication:
Characterization of InP growth in nm-sized trenches by a combination of NC-AFM and STM
Date
2014
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mannarino, Manuel
;
Eyben, Pierre
;
Chintala, Ravi Chandra
;
Merckling, Clement
;
van Dorp, Dennis
;
Vandervorst, Wilfried
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Abstract
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1884
since deposited on 2021-10-22
422
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Acq. date: 2025-10-24
Citations
Metrics
Views
1884
since deposited on 2021-10-22
422
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations