Publication:

Advanced DFT-NEGF Transport Techniques for Novel 2-D Material and Device Exploration Including HfS2/WSe2 van der Waals Heterojunction TFET and WTe2/WS2 Metal/Semiconductor Contact

Date

2021
Journal article
https://doi.org/10.1109/TED.2021.3078412
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dc.contributor.authorAfzalian, Aryan
dc.contributor.authorAkhoundi, Elaheh
dc.contributor.authorGaddemane, Gautam
dc.contributor.authorDuflou, Rutger
dc.contributor.authorHoussa, Michel
dc.contributor.imecauthorAfzalian, Aryan
dc.contributor.imecauthorAkhoundi, Elaheh
dc.contributor.imecauthorGaddemane, Gautam
dc.contributor.imecauthorDuflou, Rutger
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorAfzalian, Aryan
dc.contributor.imecauthorAkhoundi, Elaheh
dc.contributor.imecauthorGaddemane, Gautam
dc.contributor.imecauthorDuflou, Rutger
dc.contributor.imecauthorHoussa, Michel
dc.contributor.orcidimecAfzalian, Aryan::0000-0002-5260-0281
dc.contributor.orcidimecDuflou, Rutger::0000-0002-0357-1293
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecAkhoundi, Elaheh::0000-0002-6958-4812
dc.date.accessioned2021-12-16T11:08:13Z
dc.date.available2021-11-28T02:05:50Z
dc.date.available2021-12-16T11:08:13Z
dc.date.issued2021
dc.identifier.doi10.1109/TED.2021.3078412
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38492
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage5372
dc.source.endpage5379
dc.source.issue11
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages8
dc.source.volume68
dc.subject.keywordsSCHEMES
dc.title

Advanced DFT-NEGF Transport Techniques for Novel 2-D Material and Device Exploration Including HfS2/WSe2 van der Waals Heterojunction TFET and WTe2/WS2 Metal/Semiconductor Contact

dc.typeJournal article
dspace.entity.typePublication
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