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Impact of the back-gate bias on the low-frequency noise of fully depleted silicon-on-insulator MOSFETs
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Impact of the back-gate bias on the low-frequency noise of fully depleted silicon-on-insulator MOSFETs
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Date
2003
Proceedings Paper
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7418.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Mercha, Abdelkarim
;
Claeys, Cor
;
Lukyanchikova, N.
;
Garbar, N.
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1882
since deposited on 2021-10-15
Acq. date: 2025-12-11
Citations
Metrics
Views
1882
since deposited on 2021-10-15
Acq. date: 2025-12-11
Citations