Publication:

Calibrated wafer-level HBM measurements for quasi-static and transient device analysis

Date

2007
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorScholz, Mirko
dc.contributor.authorThijs, Steven
dc.contributor.authorLinten, Dimitri
dc.contributor.authorTremouilles, David
dc.contributor.authorSawada, Masanori
dc.contributor.authorNakaei, T.
dc.contributor.authorHasebe, Takumi
dc.contributor.authorNatarajan, M.I.
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-16T19:29:05Z
dc.date.available2021-10-16T19:29:05Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12857
dc.source.beginpage89
dc.source.conferenceEOS/ESD Symposium Proceedings
dc.source.conferencedate16/09/2007
dc.source.conferencelocationAnaheim, CA USA
dc.source.endpage94
dc.title

Calibrated wafer-level HBM measurements for quasi-static and transient device analysis

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions