Publication:
Exploring possibilities of band gap measurement with off-axis EELS in TEM
Date
| dc.contributor.author | Korneychuk, Svetlana | |
| dc.contributor.author | Partoens, Bart | |
| dc.contributor.author | Guzzinati, Giulio | |
| dc.contributor.author | Ramaneti, Rajesh | |
| dc.contributor.author | Derluyn, Joff | |
| dc.contributor.author | Haenen, Ken | |
| dc.contributor.author | Verbeeck, Jo | |
| dc.contributor.imecauthor | Haenen, Ken | |
| dc.contributor.orcidimec | Haenen, Ken::0000-0001-6711-7367 | |
| dc.date.accessioned | 2021-10-24T07:06:14Z | |
| dc.date.available | 2021-10-24T07:06:14Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2017 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28705 | |
| dc.identifier.url | https://arxiv.org/abs/1710.06173 | |
| dc.source.beginpage | 1710.06173 | |
| dc.source.journal | ArXiv, Materials Science | |
| dc.title | Exploring possibilities of band gap measurement with off-axis EELS in TEM | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |