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Factors determining the damage coefficient and the low-frequency noise in MeV proton-irradiated silicon diodes

Date

1998
Journal article
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorOhyama, Hidenori
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-01T08:56:06Z
dc.date.available2021-10-01T08:56:06Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2949
dc.source.beginpage89
dc.source.endpage97
dc.source.issue1
dc.source.journalIEEE Trans. Nuclear Science
dc.source.volume45
dc.title

Factors determining the damage coefficient and the low-frequency noise in MeV proton-irradiated silicon diodes

dc.typeJournal article
dspace.entity.typePublication
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