Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Design-based metrology: beyond CD/EPE metrics to evaluate printability performance
Publication:
Design-based metrology: beyond CD/EPE metrics to evaluate printability performance
Copy permalink
Date
2016
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
33750.pdf
1.52 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Halder, Sandip
;
Mailfert, Julien
;
Leray, Philippe
;
Rio, David
;
Peng, Hsin-Ying
;
Laenens, Bart
Journal
Abstract
Description
Metrics
Views
1896
since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations
Metrics
Views
1896
since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations