The length-dependence of the 1/f noise of graded-channel SOI nMOSFETs

dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.author	Chung, T.M.
dc.contributor.author	Flandre, D.
dc.contributor.author	Raskin, J.P.
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-16T19:45:09Z
dc.date.available	2021-10-16T19:45:09Z
dc.date.embargo	9999-12-31
dc.date.issued	2007
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/12903
dc.source.beginpage	373
dc.source.conference	Microelectonics Technology and Devices SBMICRO 2007
dc.source.conferencedate	3/09/2007
dc.source.conferencelocation	Rio de Janeiro Brazil
dc.source.endpage	381
dc.title	The length-dependence of the 1/f noise of graded-channel SOI nMOSFETs
dc.type	Proceedings paper
dspace.entity.type	Publication
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