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Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells

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dc.contributor.authorTio Castro, David
dc.contributor.authorGoux, Ludovic
dc.contributor.authorHurkx, G.A.M.
dc.contributor.authorAttenborough, Karen
dc.contributor.authorDelhougne, Romain
dc.contributor.authorLisoni, Judit
dc.contributor.authorJedema, F.J.
dc.contributor.authorin 't Zandt, M.A.A.
dc.contributor.authorWolters, R.A.M.
dc.contributor.authorGravesteijn, Dirk
dc.contributor.authorVerheijen, M.A.
dc.contributor.authorKaiser, M.A.
dc.contributor.authorWeemaes, R.G.R.
dc.contributor.authorWouters, Dirk
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-16T20:09:57Z
dc.date.available2021-10-16T20:09:57Z
dc.date.embargo9999-12-31
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12974
dc.source.beginpage315
dc.source.conferenceTechnical Digest International Electron Devices Meeting - IEDM
dc.source.conferencedate10/12/2007
dc.source.conferencelocationWashington, DC USA
dc.source.endpage318
dc.title

Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells

dc.typeProceedings paper
dspace.entity.typePublication
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