Publication:

Advanced PBTI reliability with 0.69nm EOT GdHfO gate dielectric

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

2010 since deposited on 2021-10-19
Acq. date: 2025-10-23

Citations

Metrics

Views

2010 since deposited on 2021-10-19
Acq. date: 2025-10-23

Citations