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Advanced PBTI reliability with 0.69nm EOT GdHfO gate dielectric
Publication:
Advanced PBTI reliability with 0.69nm EOT GdHfO gate dielectric
Date
2011
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Moon Ju
;
Aoulaiche, Marc
;
Degraeve, Robin
;
Kaczer, Ben
;
Kauerauf, Thomas
;
Ragnarsson, Lars-Ake
;
Adelmann, Christoph
;
Van Elshocht, Sven
;
Hoffmann, Thomas Y.
;
Groeseneken, Guido
Journal
Solid-State Electronics
Abstract
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2010
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
2010
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations