Publication:

Negative bias temperature instability lifetime prediction: problems and solutions

Date

2013
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorJi, Z.
dc.contributor.authorHatta, S. F. W. M.
dc.contributor.authorZhang, J. F.
dc.contributor.authorMa, G. M.
dc.contributor.authorZhang, W.
dc.contributor.authorSoin, N.
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.accessioned2021-10-21T08:35:15Z
dc.date.available2021-10-21T08:35:15Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22551
dc.source.beginpage413
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate9/12/2013
dc.source.conferencelocationWashington, DC USA
dc.source.endpage416
dc.title

Negative bias temperature instability lifetime prediction: problems and solutions

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions