Publication:

Capturing true workload dependency of BTI-induced degradation in CPU components

Date

2016
Proceedings Paper
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dc.contributor.authorStamoulis, Dimitrios
dc.contributor.authorCorbetta, Simone
dc.contributor.authorRodopoulos, Dimitrios
dc.contributor.authorWeckx, Pieter
dc.contributor.authorDebacker, Peter
dc.contributor.authorMeyer H., Brett
dc.contributor.authorKaczer, Ben
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorSoudris, Dimitrios
dc.contributor.authorCatthoor, Francky
dc.contributor.authorZilic, Zeljko
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-23T15:12:32Z
dc.date.available2021-10-23T15:12:32Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27348
dc.identifier.urlhttp://dl.acm.org/citation.cfm?doid=2902961.2902992
dc.source.beginpage373
dc.source.conferenceProceedings of the 26th Great Lakes Symposium on VLSI - GLSVLSI
dc.source.conferencedate18/05/2016
dc.source.conferencelocationBoston, MA USA
dc.source.endpage376
dc.title

Capturing true workload dependency of BTI-induced degradation in CPU components

dc.typeProceedings paper
dspace.entity.typePublication
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