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Conference contributions
Line-end gap measurement with YieldStar scatterometer: towards an OPC model calibration
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Line-end gap measurement with YieldStar scatterometer: towards an OPC model calibration
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Date
2012
Proceedings Paper
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23609.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Charley, Anne-Laure
;
Leray, Philippe
;
Cheng, Shaunee
;
Dusa, Mircea
;
Chiou, T.-B.
;
Fumar-Pici, A.
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1928
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Acq. date: 2025-12-13
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Metrics
Views
1928
since deposited on 2021-10-20
2
last month
Acq. date: 2025-12-13
Citations