Publication:

Defect characterization after ESD stress: merging TLP and Pulsed-IV techniques

Date

2015

Meeting abstract

Simple item page Full metadata Statistics

Files

31006.pdf 1.11 MB

Author(s)

Linten, Dimitri

;

;

;

Hellings, Geert

;

Chen, Shih-Hung

;

;

;

Collaert, Nadine

;

Statistics

1922 since deposited on 2021-10-22

Acq. date: 2026-02-26