Segregation revisited

dc.contributor.author	Tian, Chunsheng
dc.contributor.author	Beyer, Gerald
dc.contributor.author	Vandervorst, Wilfried
dc.contributor.author	Maex, Karen
dc.contributor.author	Kilner, J. A.
dc.contributor.imecauthor	Beyer, Gerald
dc.contributor.imecauthor	Vandervorst, Wilfried
dc.contributor.imecauthor	Maex, Karen
dc.date.accessioned	2021-09-30T09:39:36Z
dc.date.available	2021-09-30T09:39:36Z
dc.date.embargo	9999-12-31
dc.date.issued	1997
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2180
dc.source.beginpage	383
dc.source.conference	Secondary Ion Mass Spectrometry - SIMS X : Proceedings of the 10th International Conference
dc.source.conferencedate	2/10/1995
dc.source.conferencelocation	Münster Germany
dc.source.endpage	386
dc.title	Segregation revisited
dc.type	Proceedings paper
dspace.entity.type	Publication
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