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An IEEE Std 1500-based 3D design-for-test architecture
Publication:
An IEEE Std 1500-based 3D design-for-test architecture
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Date
2010-11
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Chi, Chun-Chuan
;
Verbree, Jouke
;
Konijnenburg, Mario
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1907
since deposited on 2021-10-18
Acq. date: 2025-12-14
Citations
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Views
1907
since deposited on 2021-10-18
Acq. date: 2025-12-14
Citations