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Defect localization in 3-D TSV structures by differential light-induced capacitance alteration
Publication:
Defect localization in 3-D TSV structures by differential light-induced capacitance alteration
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jacobs, Kristof J.P.
;
Stucchi, Michele
;
Afanasiev, Valeri
;
Gonzalez, Mario
;
Croes, Kristof
;
De Wolf, Ingrid
;
Beyne, Eric
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1985
since deposited on 2021-10-25
1
last month
Acq. date: 2025-12-15
Citations
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Views
1985
since deposited on 2021-10-25
1
last month
Acq. date: 2025-12-15
Citations