Publication:

Photo-conductivity lock-in: A qualitative and quantitative analysis of measurement results

Date

2008
Proceedings Paper
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dc.contributor.authorCornagliotti, Emanuele
dc.contributor.authorKang, Xuanwu
dc.contributor.authorJohn, Joachim
dc.contributor.authorBeaucarne, Guy
dc.contributor.authorPoortmans, Jef
dc.contributor.authorMertens, Robert
dc.contributor.imecauthorCornagliotti, Emanuele
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-17T06:37:21Z
dc.date.available2021-10-17T06:37:21Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13557
dc.source.beginpage1987
dc.source.conference23rd European Photovoltaic Solar Energy Conference
dc.source.conferencedate1/09/2008
dc.source.conferencelocationValencia Spain
dc.source.endpage1990
dc.title

Photo-conductivity lock-in: A qualitative and quantitative analysis of measurement results

dc.typeProceedings paper
dspace.entity.typePublication
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