Publication:
Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures
Date
| dc.contributor.author | Amat, Esteve | |
| dc.contributor.author | Kauerauf, Thomas | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Rodríguez, Rosana | |
| dc.contributor.author | Nafría, Montse | |
| dc.contributor.author | Aymerich, Xavier | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-17T21:17:45Z | |
| dc.date.available | 2021-10-17T21:17:45Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 1530-4388 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14897 | |
| dc.source.beginpage | 454 | |
| dc.source.endpage | 458 | |
| dc.source.issue | 3 | |
| dc.source.journal | IEEE Transactions on Device and Materials Reliability | |
| dc.source.volume | 9 | |
| dc.title | Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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