Publication:

Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor

Date

2015
Journal article
https://doi.org/10.7567/JJAP.54.04DE09
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dc.contributor.authorVereecke, Bart
dc.contributor.authorCavaco, Celso
dc.contributor.authorDe Munck, Koen
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorMinoglou, Kiki
dc.contributor.authorMoore, George
dc.contributor.authorSabuncuoglu Tezcan, Deniz
dc.contributor.authorTack, Klaas
dc.contributor.authorWu, Bob
dc.contributor.authorOsman, Haris
dc.contributor.imecauthorVereecke, Bart
dc.contributor.imecauthorCavaco, Celso
dc.contributor.imecauthorDe Munck, Koen
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorSabuncuoglu Tezcan, Deniz
dc.contributor.imecauthorTack, Klaas
dc.contributor.imecauthorOsman, Haris
dc.contributor.orcidimecCavaco, Celso::0000-0001-9079-338X
dc.contributor.orcidimecSabuncuoglu Tezcan, Deniz::0000-0002-9237-7862
dc.date.accessioned2021-10-23T00:35:37Z
dc.date.available2021-10-23T00:35:37Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.doi10.7567/JJAP.54.04DE09
dc.identifier.issn0021-4922
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26126
dc.identifier.urlhttp://iopscience.iop.org/article/10.7567/JJAP.54.04DE09/meta
dc.source.beginpage04DE09
dc.source.journalJapanese Journal of Applied Physics
dc.source.volume54
dc.title

Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor

dc.typeJournal article
dspace.entity.typePublication
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