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High-Sensitivity Large-Throughput Broadband Tunable Microwave Wear Debris Sensing System

 
dc.contributor.authorZhang, Meng
dc.contributor.authorEl Ghannudi, Hamza
dc.contributor.authorMarcaccioli, Luca
dc.contributor.authorMontori, Simone
dc.contributor.authorBao, Xiue
dc.contributor.authorMarkovic, Tomislav
dc.contributor.authorOcket, Ilja
dc.contributor.authorSorrentino, Roberto
dc.contributor.authorNauwelaers, Bart
dc.contributor.imecauthorMarkovic, Tomislav
dc.contributor.imecauthorOcket, Ilja
dc.contributor.orcidimecMarkovic, Tomislav::0000-0002-9645-5565
dc.contributor.orcidimecOcket, Ilja::0000-0002-1503-7397
dc.date.accessioned2023-01-03T10:58:24Z
dc.date.available2022-01-07T02:05:18Z
dc.date.available2023-01-03T10:58:24Z
dc.date.issued2022
dc.description.wosFundingTextThe work of Meng Zhang was supported in part by the European Microwave Association (EuMA) Internship Award 2019; and in part by RF Microtech Srl, Perugia, Italy, with system components and lab facilities.
dc.identifier.doi10.1109/JSEN.2021.3129611
dc.identifier.issn1530-437X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38716
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage304
dc.source.endpage314
dc.source.issue1
dc.source.journalIEEE SENSORS JOURNAL
dc.source.numberofpages11
dc.source.volume22
dc.title

High-Sensitivity Large-Throughput Broadband Tunable Microwave Wear Debris Sensing System

dc.typeJournal article
dspace.entity.typePublication
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