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Conference contributions
EUV mask defectivity: status and mitigation towards HVM
Publication:
EUV mask defectivity: status and mitigation towards HVM
Date
2010
Proceedings Paper
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20875.pdf
1.83 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jonckheere, Rik
;
Van Den Heuvel, Dieter
;
Lamantia, Matthew
;
Baudemprez, Bart
;
Hendrickx, Eric
;
Ronse, Kurt
Journal
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1918
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1918
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations