Publication:

Integral Impact of BTI, PVT-variation and Workload on SRAM Sense Amplifier

Date

2017
Journal article
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dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorKraak, Daniel
dc.contributor.authorHamdioui, Said
dc.contributor.authorKukner, Halil
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-24T02:51:25Z
dc.date.available2021-10-24T02:51:25Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn1063-8210
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27723
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7819518/
dc.source.beginpage1444
dc.source.endpage1454
dc.source.issue4
dc.source.journalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
dc.source.volume25
dc.title

Integral Impact of BTI, PVT-variation and Workload on SRAM Sense Amplifier

dc.typeJournal article
dspace.entity.typePublication
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