Publication:

A ballistic electron emission microscopy (BEEM) study of the barrier height change of Au/n-GaAs Schottky barriers due to reactive ion etching

Date

1997
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorVanalme, G. M.
dc.contributor.authorVan Meirhaeghe, R. L.
dc.contributor.authorCardon, F.
dc.contributor.authorVan Daele, Peter
dc.contributor.imecauthorVan Daele, Peter
dc.contributor.orcidimecVan Daele, Peter::0000-0003-0557-7741
dc.date.accessioned2021-09-30T09:56:04Z
dc.date.available2021-09-30T09:56:04Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2260
dc.source.beginpage907
dc.source.endpage912
dc.source.journalSemiconductor Science and Technology
dc.source.volume12
dc.title

A ballistic electron emission microscopy (BEEM) study of the barrier height change of Au/n-GaAs Schottky barriers due to reactive ion etching

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
2236.pdf
Size:
127.79 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles